images/nanosurf.jpg All the research facilities are located in room 0.07 in Mecânica II at Alameda Campus of Instituto Superior Técnico.

Scanning Probe Microscope NanoSurf Easyscan 2 (tip-scanning type)

  • Constant Current mode and Constant Height mode
  • dc contact modes (Force Modulation, Constant Force mode, Lateral Force Imaging)
  • ac modes (tapping, non-contact, MFM, EFM, Phase Imaging, Amplitude Imaging)
  • AFM Nanolithography
  • AFM Force-distance Spectroscopy
  • Electrochemical mode
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    Scanning Probe system Veeco DI CP-II

  • Constant Current mode and Constant Height mode
  • dc contact modes (Constant Force mode, Lateral Force Imaging)
  • ac modes (tapping, non-contact, MFM, EFM, Phase Imaging, Amplitude Imaging)
  • AFM Nanolithography
  • AFM Force-distance Spectroscopy
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    CSM Nanotribometer

  • Reciprocal movement in dry and liquid conditions
  • Characterization of the tribological properties of a wide range of surfaces at low contact pressures
  • Unique quad beam cantilever with normal load applied up to 1000 mN (resolution 3 nN)

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    TA.XT Express Texture Analyser

  • Entry-level and QC-based texture analysis
  • Force Capacity: 5kg.f (50N); 1kg.f (10N) optional
  • Force Resolution: 0.1g
  • Loadcells: 0.5kg, 5kg, 10kg
  • Speed Range: 0.1 - 10mm/s
  • Sample Test Area: 247x228mm

  • Inverted Epi and Diascopic Optical Microscope Olympus IX51

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  • Integrated operation with the NanoSurf scanning probe system
  • Digital image acquisition

  • HPLC Waters system

  • Alliance 2695(Capacity: 120 samples, Temperature range: RT to 65ºC, Empower 2 post processor software)
  • Separate, identify, and quantify polar and non polar components