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All the research facilities are located in room 0.07 in Mecânica II at Alameda Campus of Instituto Superior Técnico.
Scanning Probe Microscope NanoSurf Easyscan 2 (tip-scanning type)
Constant Current mode and Constant Height mode
dc contact modes (Force Modulation, Constant Force mode, Lateral Force Imaging)
ac modes (tapping, non-contact, MFM, EFM, Phase Imaging, Amplitude Imaging)
AFM Nanolithography
AFM Force-distance Spectroscopy
Electrochemical mode
Scanning Probe system Veeco DI CP-II
Constant Current mode and Constant Height mode
dc contact modes (Constant Force mode, Lateral Force Imaging)
ac modes (tapping, non-contact, MFM, EFM, Phase Imaging, Amplitude Imaging)
AFM Nanolithography
AFM Force-distance Spectroscopy
Optical profilometer Profilm 3D
Measures surface profiles and roughness down to 0.05 ”m
minimum vertical feature size down to 0.001 ”m
Objective 20x: Field-of-View of 1.0 x 0.85 mm
CSM Nanotribometer
Reciprocal movement in dry and liquid conditions
Characterization of the tribological properties of a wide range of surfaces at low contact pressures
Unique quad beam cantilever with normal load applied up to 1000 mN (resolution 3 nN)
Tribometer (TRB3)
Has a wide range of testing parameters and contact geometries, such as different movement modes (rotational, linear, reciprocating), contact modes, speed, lubrication, etc.
Normal Force Range (and Resolution): up to 60 N (dead weight)
Friction Force Range (and Resolution): up to 20 N (0.015 mN)
TA.XT Express Texture Analyser
Entry-level and QC-based texture analysis
Force Capacity: 5kg.f (50N); 1kg.f (10N) optional
Force Resolution: 0.1g
Loadcells: 0.5kg, 5kg, 10kg
Speed Range: 0.1 - 10mm/s
Sample Test Area: 247x228mm
Inverted Epi and Diascopic Optical Microscope Olympus IX51
Integrated operation with the NanoSurf scanning probe system
Digital image acquisition
HPLC Waters system
Alliance 2695(Capacity: 120 samples, Temperature range: RT to 65șC, Empower 2 post processor software)
Separate, identify, and quantify polar and non polar components
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